The continuous emergence of electron optics, detectors, and other fields of science has opened an entirely new class of experiments in materials characterization. The objective of this module is to highlight the importance of electron microscopes in materials science, and provide a global understanding the existing techniques, limitations and actual progress in this field.
Basics of Electron Microscopy
Scanning Electron Microscopy & STEM
Transmission Electron Microscopy (TEM)
Extensions of SEM, STEM and TEM
Advanced & Future Applications of SEM, TEM and STEM
The students will have an overview of the basic and experimental possibilities of SEM, STEM and TEM techniques, especially in connection with synthesis and investigation of nanomaterials.
 Williams D.B., Carter C.B. Transmission electron microscopy: a textbook for materials science, 2nd editon. Springer 2009.
 Pennycook S.J., Nellist P.D. Scanning Transmission Electron Microscopy: Imaging and Analysis. Springer 2011.
 Echlin P. Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis. Springer 2011.
 Egerton R.F. Electron Energy-Loss Spectroscopy in Electron Microscope, 3rd edition. Springer 2011.
 Yamamoto N. Cathodoluminescence. Intech 2012. (Open source).
 Goldstein J. Scanning Electron Microscopy and X-Ray Microanalysis, 4th edition. Springer 2018.
 Zewail A.H., Thomas J.M. 4D Electron Microscopy: Imaging in Space and Time. Imperial College Press 2010.
 Reimer L. Transmission Electron Microscopy: Physics of Image Formation and Image Analysis, 4th edition. Springer 2013.
 Zou X., Hovmöller S., Oleynikov P. Electron Crystallography: Electron Microscopy and Electron Diffraction. International Union of Crystallography. Oxford University Press 2012.
To be Announced
Prof. Dr. Christoph J. Brabec and M. Sc. Jack Elia (both FAU – University of Erlangen-Nürnberg)