Principles of X-ray Techniques & Lab Demo

Abstract

The objective of this course is to highlight the fundamentals and applications of X-rays in different fields of science and technology. Historical and practical aspects of X-rays will be introduced in this course. This module will discuss 4 main parts of X-rays applications: Diffraction, Scattering, Imaging and Spectroscopy. Each part will provide a historical overview, highlight the existing techniques, softwares, databases and the recent advances in the field.

Glossary

Chapter 1
Basics of
X-ray and applications
Chapter 2
X-ray Diffraction and applications
Chapter 3
X-ray Scattering and applications
Chapter 4
X-ray imaging and applications
Chapter 5
X-ray Spectroscopy and applications

Learning Outcomes

The students will have an overview of the basic and experimental and technical possibilities of X-ray techniques, and the connection with Material science and biological/medical applications.

Bibliography

[01] Guinebretière R. X-ray Diffraction by Polycrystalline Materials. John Wiley & Sons 2013.
[02] Sharma S. K. X-ray Spectroscopy. Intech 2012.
[03] Ares A. E. X-ray Scattering. Intech 2017.
[04] Sharma S. K. X-ray Spectroscopy. Intech 2012.
[05] Chandrasekaran A. Current Trends in X-Ray Crystallography. Intech 2011.
[06] Benedict J. B. Recent Advances in Crystallography. Intech 2012.
[07] Khodaei M. X-ray Characterization of Nanostructured Energy Materials by Synchrotron Radiation. Intech 2017.
[08] Subburaj K. CT Scanning. Intech 2011.
[09] Franco M. Small Angle Scattering and Diffraction. Intech 2018.
[10] Zschornack G. Handbook of X-ray Data. Intech 2007.
[11] Tsuji K, Injuk J, Van Grieken R. X-Ray Spectrometry: Recent Technological Advances. John Wiley & Sons 2004.
[12] Poulsen H. F. Three-Dimensional X-Ray Diffraction Microscopy. Springer 2004.
[13] Waseda Y. Anomalous X-ray scattering for materials characterization: atomic-scale structure determination. Springer; 2003

External Evaluator

Is still to be determined

Responsible Academic

PD Dr. Miroslaw Batentschuk and M. Sc. Jack Elia (both FAU – University of Erlangen-Nürnberg)

Awarded ECTS

2.5